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Updated: Aug 19, 2026
High-resolution Episcopic Microscopy (HREM) - Simple and Robust Protocols for Processing and Visualizing Organic Materials
Published on: July 7, 2017
A versatile double aberration-corrected, energy filtered HREM/STEM for materials science
John L Hutchison1, John M Titchmarsh, David J H Cockayne
1Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK. john.hutchison@materials.ox.ac.uk
Abstract:
A HREM/STEM incorporating aberration correctors in both the probe-forming and imaging lenses has been installed at Oxford University. This unique instrument is also equipped with an in-column energy-loss (Omega-type) filter, HAADF detectors above and beneath the filter, and an EDX system. Initial tests have shown it to be capable of approximately 0.1 nm resolution in both TEM and HAADF STEM imaging modes. Some examples of applications are finally presented.
