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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

Electron-phonon interaction and transport in semiconducting carbon nanotubes

Vasili Perebeinos1, J Tersoff, Phaedon Avouris

  • 1IBM Research Division, T. J. Watson Research Center, Yorktown Heights, NY 10598, USA.

Physical Review Letters
|March 24, 2005
PubMed

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