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Updated: Aug 18, 2026

Atomically Traceable Nanostructure Fabrication
Published on: July 17, 2015
Directed self-assembly of Ge nanostructures on very high index, highly anisotropic Si(hkl) surfaces
Kenji Ohmori1, Y L Foo, Sukwon Hong
1Frederick-Seitz Materials Research Laboratory and Department of Materials Science, University of Illinois, 104 South Goodwin Avenue, Urbana, IL 61801, USA. ohmori@mrl.uiuc.edu
Abstract:
Families of very high-index planes, such as those which bifurcate spontaneously to form a hill-and-valley structure composed of opposing facets, provide natural templates for the directed growth of position-controlled self-organized nanostructures with shapes determined by the facet width ratio R. For example, deposition of a few ML of Ge on Si(173 100 373), corresponding to R(113/517) = 1.7, results in a field of 40-nm-wide Ge nanowires along [72 187] with a uniform period of 60 nm.

