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Full-field strain mapping by optical correlation of micrographs acquired during deformation

J Quinta D A Fonseca1, P M Mummery, P J Withers

  • 1Manchester Materials Science Centre, Grosvenor Street, Manchester M1 7HS, U.K. joao.fonseca@manchester.ac.uk

Journal of Microscopy
|April 9, 2005
PubMed
Summary

Optical correlation provides full-field surface strain mapping by comparing images before, during, and after deformation. This technique analyzes micrographs from in situ deformation studies without surface preparation, revealing strain heterogeneity linked to microstructure.

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