Full-field strain mapping by optical correlation of micrographs acquired during deformation

J Quinta D A Fonseca1, P M Mummery, P J Withers

  • 1Manchester Materials Science Centre, Grosvenor Street, Manchester M1 7HS, U.K. joao.fonseca@manchester.ac.uk

Journal of Microscopy
|April 9, 2005
PubMed