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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Photoelectron spectroscopy of fullerene dianions C76(2-), C78(2-), and C84(2-)
Oli T Ehrler1, Filipp Furche, J Mathias Weber
1Institut für Physikalische Chemie, Universität Karlsruhe, Kaiserstrasse 12, D-76128 Karlsruhe, Germany.
Abstract:
We report laser photoelectron spectra of the doubly negatively charged fullerenes C(76) (2-), C(78) (2-), and C(84) (2-) at 2.33, 3.49, and 4.66 eV photon energy. From these spectra, second electron affinities and vertical detachment energies, as well as estimates for the repulsive Coulomb barriers are obtained. These results are discussed in the context of electrostatic models. They reveal that fullerenes are similar to conducting spheres, with electronic properties scaling with their size. The experimental spectra are compared with the accessible excited states of the respective singly charged product ions calculated in the framework of time dependent density functional theory.
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