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The detection of small relative simulated field defects using multifocal VEPs
1Department of Optometry and Radiography, The Hong Kong Polytechnic University, China. orhenry@polyu.edu.hk
Summary
The multifocal visual-evoked potential (mfVEP) can detect simulated relative field defects as small as 5 degrees. This objective visual field testing method shows sensitivity comparable to established visual field analyzers.
Area of Science:
- Ophthalmology
- Neuroscience
- Visual Science
Background:
- The multifocal visual-evoked potential (mfVEP) is a key tool for studying visual system diseases.
- Its sensitivity for objectively detecting relative field defects remains under investigation.
- This study explores mfVEP response variations under simulated relative field defects.
Purpose of the Study:
- To determine the sensitivity of mfVEP in detecting simulated relative field defects.
- To compare mfVEP responses with and without simulated defects at varying eccentricities.
Main Methods:
- Simulated relative field defects were created using 0.2, 0.4, 0.6, and 0.8 neutral density (ND) filters.
- These filters were applied to a 5-degree stimulus at 10 and 16 degrees retinal eccentricity.
- mfVEP amplitudes and latencies (N1, P1) were measured in 11 normal subjects.
Main Results:
- Significant decreases in mfVEP N1 and P1 amplitudes were observed with 0.6 and 0.8 ND filters.
- These amplitude reductions occurred similarly at 10 and 16 degrees eccentricity.
- No changes in mfVEP latency were detected with the simulated field defects.
Conclusions:
- mfVEP successfully detects simulated 5-degree relative field defects with a 0.6 log unit luminance reduction.
- Detection capabilities were consistent at both 10 and 16 degrees eccentricity.
- mfVEP sensitivity is comparable to the Humphrey Visual Field Analyser for these defects.
