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Updated: Aug 17, 2026

Growth and Electrostatic/chemical Properties of Metal/LaAlO3/SrTiO3 Heterostructures
Published on: February 8, 2018
Ab initio design of high-k dielectrics: La(x)Y1-xAlO3
Stephen A Shevlin1, Alessandro Curioni, Wanda Andreoni
1IBM Research, Zurich Research Laboratory, 8803 Rüschlikon, Switzerland.
Abstract:
We use calculations based on density-functional theory in the virtual crystal approximation for the design of high-k dielectrics, which could offer an alternative to silicon dioxide in complementary metal-oxide semiconductor devices. We show that aluminates LaxY1-xAlO3 alloys derived by mixing aluminum oxide with lanthanum and yttrium oxides have unique physical attributes for a possible application as gate dielectrics when stabilized in the rhombohedral perovskite structure, and which are lost in the orthorhombic modification. Stability arguments locate this interesting composition range as 0.2
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