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High harmonic XUV spectral phase interferometry for direct electric-field reconstruction
Y Mairesse1, O Gobert, P Breger
1DSM-DRECAM-Service des Photons, Atomes et Molécules, CEA Saclay, 91191 Gif-sur-Yvette Cedex, France.
Physical Review Letters
|May 21, 2005
Summary
We present the first complete temporal characterization of high-harmonic extreme ultraviolet (XUV) pulses using spectral phase interferometry. This all-optical method achieves single-shot measurements, revealing high stability and enabling precise XUV pulse analysis.
Area of Science:
- Attosecond science
- Quantum optics
- Laser-matter interactions
Background:
- Characterizing ultrashort light pulses is crucial for ultrafast science.
- Previous methods for extreme ultraviolet (XUV) pulse characterization were limited.
- High-harmonic generation (HHG) produces ultrashort XUV pulses, but their temporal profiles are complex.
Purpose of the Study:
- To demonstrate a novel, all-optical method for complete temporal characterization of high-harmonic XUV pulses.
- To enable single-shot measurements of XUV pulse duration and spectral phase.
- To investigate the stability and compressibility of HHG pulses.
Main Methods:
- Spectral phase interferometry (SPI) was employed in an all-optical setup.
- High-harmonic XUV pulses were generated in argon using a 50 fs, 800 nm laser.
- Single-shot measurements captured the temporal profile and phase of the 11th harmonic.
Main Results:
- The 11th harmonic pulse was characterized as 22 fs long with a negative chirp.
- A negative chirp rate of -4.8 x 10^27 s^-2 was measured.
- Pulse duration was reduced to 13 fs by modulating the generating laser's polarization.
Conclusions:
- The developed SPI technique provides a complete temporal characterization of high-harmonic XUV pulses.
- The method demonstrates remarkable shot-to-shot stability and ease of implementation.
- This technique is suitable for routine use in femtosecond XUV pump-probe experiments.