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On the peculiarities of CBED pattern formation revealed by multislice simulation

A Chuvilin1, U Kaiser

  • 1University of Ulm, Albert-Einstein-Alee 11, D-89081 Ulm, Germany. andrey.chuvilin@physik.uni-ulm.de

Ultramicroscopy
|June 7, 2005
PubMed
Summary

A new multislice method improves Convergent Beam Electron Diffraction (CBED) pattern analysis. It reveals how dynamical scattering of Higher-Order Laue Zone (HOLZ) reflections impacts central disk patterns and sample structural information.

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