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Updated: Aug 15, 2026

Preparing Adherent Cells for X-ray Fluorescence Imaging by Chemical Fixation
Published on: March 12, 2015
Analysis of wrapped or cased object by a hand-held X-ray fluorescence spectrometer
1Department of Materials Science and Engineering, Kyoto University, Sakyo-ku, Kyoto 606-8501, Japan. ida@kpp.mbox.media.kyoto-u.ac.jp
Abstract:
Metals, alloys, and poisoned food were analyzed with a hand-held X-ray fluorescence (XRF) spectrometer, with a shield (wrapping or casing material) inserted between these objects and the spectrometer, in order to examine the possibility of analyzing the contents of packages. Elements such as Fe, Cr, Ni, Cu, Zn, Pb, Mo, and As were detected in the objects. The fluorescent intensity of each element in the object decreased exponentially as the thickness of the shield increased, and the degree of decrease depended on both the material of the shield and the energy of fluorescent X-rays. The thickness of the shield can be calculated by using the intensity ratio Fe Kbeta/Kalpha or Pb Lbeta/Lalpha when the object is iron or lead, or by using the intensity of the Compton scattering of incident X-rays. The original peak intensity, i.e. intensity without a shield, of an element in an object can be estimated with the thickness of the shield obtained. Because the original peak intensity is calculated using an exponential function of the thickness of the shield, calculation of the intensity ratio, e.g. Zn Kalpha/Cu Kalpha for brass, is effective for cancelling the estimation error for the thickness of the shield. The composition of brass and steel can be estimated with an error of less than 30% by using the intensity of the Compton scattering.
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