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Test equating in the presence of DIF items

Kwang-lee Chu1, Akihito Kamata

  • 1Harcourt Assessment, Inc., 19500 Bulverde Rd, San Antonio, TX 78259-3701, USA. kwang-lee_chu@harcourt.com

Journal of Applied Measurement
|June 9, 2005
PubMed
Summary

This study introduces a new multilevel measurement model to address differential item functioning (DIF) in test equating. The proposed model demonstrated superior accuracy and stability in parameter estimates compared to traditional methods.

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