Determination of optical birefringence by using off-axis transmission ellipsometry

Gerald E Jellison1, Christopher M Rouleau

  • 1Oak Ridge National Laboratory, Condensed Matter Sciences Division, Building 3025, MS 6030, P.O. Box 2008, Oak Ridge, Tennessee 37831-6030, USA. jellisongejr@ornl.gov

Applied Optics
|June 10, 2005
PubMed