Local denoising of digital speckle pattern interferometry fringes by multiplicative correlation and weighted

Alejandro Federico1, Guillermo H Kaufmann

  • 1Física y Metrología, Instituto Nacional de Tecnología Industrial, P.O. Box B1650WAB, B1650KNA San Martin, Argentina. federico@inti.gov.ar

Applied Optics
|June 10, 2005
PubMed