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Updated: Aug 17, 2026

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
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Atomic imaging in EBCO superconductor films by an X-ray holography system using a toroidally bent graphite analyzer

Tsuguhisa Sekioka1, Kouichi Hayashi, Eiichiro Matsubara

  • 1Graduate School of Engineering, University of Hyogo, 2167 Shosha, Himeji, Hyogo 671-2201, Japan. sekioka@eng.u-hyogo.ac.jp

Journal of Synchrotron Radiation
|June 22, 2005
PubMed

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