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Gold-coated conducting-atomic force microscopy probes.

Neena Susan John1, G U Kulkarni

  • 1Chemistry and Physics of Materials Unit, Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur P.O., Bangalore-560064, India.

Journal of Nanoscience and Nanotechnology
|July 12, 2005
PubMed
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Gold-coated conductive probes in conducting atomic force microscopy (C-AFM) show optimal performance around 100-150 nN. Higher forces cause deformation, while high currents lead to gold coating melting.

Area of Science:

  • Materials Science
  • Nanotechnology
  • Surface Science

Background:

  • Conductive probes are essential for conducting atomic force microscopy (C-AFM).
  • Understanding nanocontact performance is crucial for C-AFM applications.
  • Gold coatings are commonly used for AFM tips due to their conductivity.

Purpose of the Study:

  • To investigate the electrical performance of gold-coated conductive probes in C-AFM.
  • To determine the relationship between applied force, nanocontact resistance, and tip integrity.
  • To identify the limits of current and force before failure.

Main Methods:

  • Utilized conducting atomic force microscopy (C-AFM) with gold-coated probes.
  • Monitored nanocontact resistance between the AFM tip and a graphite substrate.

Related Experiment Videos

  • Varied applied forces and current levels to observe performance changes.

    • Main Results:

    • Low resistance (kiloohms) observed at small forces (<50 nN).
    • Minimal contact resistance achieved within the 100-150 nN force range.
    • Plastic deformation of the tip occurred beyond 150 nN.
    • High currents (approx. 100 microA) increased resistance and caused gold coating melting.

    Conclusions:

    • Optimal force range for gold-coated C-AFM probes is 100-150 nN for minimal resistance.
    • Exceeding force limits leads to irreversible tip deformation.
    • Current limits must be respected to prevent tip damage and melting.