Radiative auger effect and extended X-ray emission fine structure (EXEFS)

Area of Science:

• Atomic Physics
• Solid-State Physics
• Materials Science

Background:

• Radiative Auger spectra are weak X-ray emissions near characteristic X-ray lines.
• The radiative Auger process involves atomic many-body effects and energy loss during photon emission.
• These spectra reveal unoccupied conduction band structures in materials.

Purpose of the Study:

• To introduce Extended X-ray Emission Fine Structure (EXEFS) as an alternative to X-ray absorption spectroscopy.
• To highlight the utility of radiative Auger effect studies for material characterization.
• To review applications and basic results of the radiative Auger effect.

Main Methods:

• Utilizing radiative Auger spectra to probe electronic structure.
• Comparing EXEFS with X-ray absorption spectroscopy techniques like EXAFS and XANES.
• Employing commercially available X-ray fluorescence spectrometers or electron probe microanalyzers (EPMA).

Main Results:

• EXEFS spectra can be obtained rapidly (within 20 minutes).
• The radiative Auger effect provides insights into crystal and electronic structures.
• The method has found practical applications in various industries.

Conclusions:

• Atomic many-body effect studies, exemplified by the radiative Auger effect, are powerful tools for material characterization.
• EXEFS offers a viable and efficient alternative for analyzing material electronic and crystal structures.
• The EXEFS method is applicable in industrial settings for material analysis.