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Angular sensitivities of volume gratings for substrate-mode optical interconnects
Shun-Der Wu1, Thomas K Gaylord, Elias N Glytsis
1School of Electrical and Computer Engineering, Microelectronics Research Center, Georgia Institute of Technology, Atlanta 30332, USA. gte782q@prism.gatech.edu
Applied Optics
|July 29, 2005
Summary
Pitch misalignment significantly impacts slanted volume gratings (VGs) used in optical interconnects. This study reveals pitch errors can reduce diffraction efficiency by over 58%, highlighting VG performance sensitivity.
Area of Science:
- Optoelectronics
- Optical Engineering
- Microelectronics
Background:
- Substrate-mode optical interconnects are crucial for microelectronics.
- Slanted volume gratings (VGs) are key components in these interconnects.
- Manufacturing tolerances can lead to angular misalignments in VGs.
Purpose of the Study:
- Analyze angular sensitivities of slanted VGs under 3-D Gaussian beams.
- Investigate the impact of yaw, pitch, and roll misalignments on VG performance.
- Determine the most critical misalignment for optical interconnect efficiency.
Main Methods:
- Applied 3-D finite-beam rigorous coupled-wave analysis (RCWA).
- Simulated performance under varying angular misalignments (yaw, pitch, roll).
- Considered two linear polarization states (E⊥K and H⊥K).
Main Results:
- Yaw and roll misalignments showed minimal impact on diffraction efficiency.
- Pitch misalignment caused significant efficiency reduction: 61.04% (E⊥K) and 58.63% (H⊥K).
- Worst-case misalignment ranges: yaw (±1.17°), pitch (±3.04°), roll (±3.04°).
Conclusions:
- Volume grating (VG) optical interconnect performance is most sensitive to pitch misalignment.
- Pitch errors pose a substantial risk to the efficiency of substrate-mode optical interconnects.
- Understanding these sensitivities is vital for optimizing microelectronic optical interconnect design.