Complete characterization of periodic optical sources by use of sampled test-plus-reference interferometry

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The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry
12:14

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

Published on: August 12, 2013

Christophe Dorrer1

  • 1Bell Laboratories-Lucent Technologies, 791 Holmdel-Keyport Road, Holmdel, New Jersey 07733, USA. dorrer@lucent.com

Optics Letters
|August 12, 2005
PubMed

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