Related Experiment Video
Updated: Aug 16, 2026

12:27
Assembly, Tuning and Use of an Apertureless Near Field Infrared Microscope for Protein Imaging
Published on: November 25, 2009
Identifying the subwavelength-aperture-width variation in the far field with tunable asymmetrically-embedded-aperture
1Department of Photonics, Institute of Electro-Optical Engineering, Microelectronics and Information System Research Center, National Chiao Tung University, Hsinchu 300, Taiwan. scchu.eo92g@nctu.edu.tw
Summary
This study introduces a tunable asymmetrically-embedded-aperture interferometer to significantly boost measurement sensitivity for subwavelength variations. Adjusting the reference aperture
Area of Science:
- Optics and Photonics
- Metrology
- Nanotechnology
Background:
- Subwavelength variations pose challenges for precise measurement.
- Existing interferometry methods have limitations in sensitivity and tunability.
- Asymmetric aperture configurations offer potential for enhanced optical measurements.
Purpose of the Study:
- To propose and analyze a tunable asymmetrically-embedded-aperture interferometer.
- To enhance the measurement sensitivity for detecting subwavelength variations.
- To investigate the tunability of detection sensitivity through aperture positioning.
Main Methods:
- Development of a tunable asymmetrically-embedded-aperture interferometer configuration.
- Asymmetric positioning of a reference aperture relative to a test aperture.
- Analysis of sensitivity enhancement by shifting the relative aperture position.
- Far-field detection and tolerance analysis.
Main Results:
- The proposed configuration enhances measurement sensitivity for subwavelength variations.
- Sensitivity can be tuned to a desired value by adjusting the reference aperture's position.
- Demonstrated superior performance compared to standard embedded-aperture interferometry, particularly regarding tolerance.
Conclusions:
- Tunable asymmetrically-embedded-aperture interferometry offers a novel approach for high-sensitivity subwavelength measurements.
- The method provides adjustable sensitivity for specific detection widths.
- This technique shows improved tolerance characteristics, making it practical for various applications.

