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Updated: Aug 9, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

Identifying contact effects in electronic conduction through C60 on silicon

G-C Liang1, A W Ghosh

  • 1School of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana 47907, USA.

Physical Review Letters
|October 4, 2005
PubMed

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