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Superresolution in total internal reflection tomography.

Kamal Belkebir1, Patrick C Chaumet, Anne Sentenac

  • 1Institut Fresnel, UMR-CNRS 6133, Campus de Saint Jérôme, case 162, Université d'Aix-Marseille I & III, 13397 Marseille Cedex 20, France. kamal.belkebir@fresnel.fr

Journal of the Optical Society of America. A, Optics, Image Science, and Vision
|October 11, 2005
PubMed
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We developed a new 3D nonlinear inversion method for total internal reflection tomography. This technique accurately maps object permittivity using evanescent waves, improving imaging resolution and robustness to noise.

Area of Science:

  • Optics and Photonics
  • Electromagnetism
  • Computational Imaging

Background:

  • Total internal reflection (TIR) microscopy utilizes evanescent waves for high-resolution imaging near interfaces.
  • Tomography reconstructs 3D information from limited angular projections, but TIR-based tomography faces challenges in resolution and reconstruction accuracy.
  • Accurate reconstruction of material properties (permittivity) from scattered fields is crucial for advanced material characterization.

Purpose of the Study:

  • To propose and validate a full-vectorial, three-dimensional nonlinear inversion scheme for total internal reflection (TIR) tomography.
  • To investigate the impact of illumination parameters (solid angle, polarization, interface position) on image resolution.
  • To compare the nonlinear inversion approach with a linear method and highlight the significance of multiple scattering effects.

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Main Methods:

  • Simulating a TIR tomography experiment with an unknown object illuminated by evanescent waves.
  • Developing a full-vectorial 3D nonlinear inversion algorithm to retrieve the object's permittivity map from scattered far-field data.
  • Comparing the nonlinear inversion results with a linear inversion scheme based on the renormalized Born approximation.
  • Analyzing the influence of illumination geometry and polarization on reconstruction quality.
  • Assessing the algorithm's sensitivity to noise and the benefits of combining propagative and evanescent waves.

Main Results:

  • The proposed nonlinear inversion scheme successfully retrieves the permittivity map of the object.
  • Multiple scattering effects significantly influence the reconstruction in this TIR configuration.
  • Image resolution is dependent on the solid angle of illumination, incident polarization, and prism interface position.
  • The nonlinear method demonstrates superior performance compared to the linear Born approximation approach.
  • Combining propagative and evanescent waves enhances the reconstruction's robustness against noise.

Conclusions:

  • Full-vectorial 3D nonlinear inversion is effective for TIR tomography, enabling accurate permittivity mapping.
  • Understanding and incorporating multiple scattering is essential for high-fidelity reconstructions in TIR configurations.
  • Optimizing illumination parameters and wave types can significantly improve imaging resolution and noise resilience.
  • This advanced tomographic technique offers a powerful tool for nanoscale material characterization and imaging.