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Related Experiment Videos

High-refractive-index measurement with an elastomeric grating coupler.

Askin Kocabas1, Feridun Ay, Aykutlu Dâna

  • 1Türk Telekom Bilkent Laboratory, Department of Physics, Bilkent University, Ankara, Turkey.

Optics Letters
|December 14, 2005
PubMed
Summary

Researchers developed a new method using elastomeric grating couplers to precisely measure modal indices in silicon-on-insulator waveguides. This technique accurately determines high refractive indices without damaging the waveguide surface.

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Area of Science:

  • Optoelectronics
  • Materials Science
  • Nanophotonics

Background:

  • Silicon-on-insulator (SOI) waveguides are crucial for integrated optics.
  • Accurate measurement of modal and bulk indices is essential for device design and performance.
  • Existing methods may lack precision or risk surface damage.

Purpose of the Study:

  • To present a novel elastomeric grating coupler for precise modal index measurement in SOI waveguides.
  • To demonstrate a non-damaging technique for high refractive index determination.

Main Methods:

  • Fabrication of an elastomeric grating coupler using replica molding.
  • Utilizing van der Waals interaction for conformal contact with the waveguide.
  • Measuring coupling angles to determine modal and bulk indices.

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Main Results:

  • Achieved precision better than 10(-3) for high refractive index measurements.
  • Demonstrated successful removal of the elastomeric stamp without waveguide surface damage.
  • Validated the technique for measuring modal indices of SOI planar waveguide structures.

Conclusions:

  • The elastomeric grating coupler offers a precise and non-destructive method for optical characterization.
  • This technique is suitable for measuring high refractive indices in nanophotonic structures.
  • The van der Waals-based conformal contact ensures reliable coupling and accurate results.