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Updated: Jul 31, 2026

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Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
Published on: July 17, 2015
Matrix-dependent structure of GeSi nanocrystals in SiC
Johannes Biskupek1, Ute Kaiser, Konrad Gärtner
1Electron Microscopy Group of Materials Science, University of Ulm 89069 Ulm, Germany. johannes.biskupek@uni-ulm.de
Journal of Electron Microscopy
|December 24, 2005
Abstract:
It is shown experimentally that GeSi nanocrystals in SiC created after high-dose Ge ion implantation and high-temperature annealing are hexagonal in a hexagonal 4H-SiC matrix and are of cubic structure in a cubic 3C-SiC matrix. This interesting fact could be explained by molecular dynamics as the force of the system nanocrystal-matrix to minimize its interface energy.

