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Updated: Aug 13, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Frequency-resolved interferometer measurements of polarized wave propagation in scattering media
Timothy D Gerke1, Mark A Webster, Andrew M Weiner
1School of Electrical and Computer Engineering, Purdue University, 465 Northwestern Avenue, West Lafayette, Indiana 47907-2035, USA.
Abstract:
An interferometric technique is utilized to measure both the time- and frequency-domain optical fields scattered by a random medium. The method uses a tunable continuous-wave laser source to make frequency-resolved measurements within a fixed-path-length interferometer. Measured frequency-domain field statistics, with a linearly polarized input, are shown to be zero-mean, circular complex Gaussian for both co- and cross-polarization states. With decreasing scatter, the extracted average impulse responses for co- and cross-polarized states show distinct differences, thereby providing insight into the scattering domain.
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