K Zinoviev1, C Dominguez, J A Plaza
1Instituto de Microelectronica de Barcelona, Centro Nacional de Microelectronica, Consejo Superior de Investigaciones Cientificas, Universitat Autonoma de Barcelona, Cerdanyola del Valles, Barcelona 08193, Spain. kirill.zinoviev@cnm.es
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This study introduces a novel optical waveguide method using diffraction gratings to precisely measure minute cantilever deflections. The technique offers a sensitive alternative for detecting ultrasmall movements in silicon dioxide microcantilevers.
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