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Fabrication of Low Temperature Carbon Nanotube Vertical Interconnects Compatible with Semiconductor Technology
Published on: December 7, 2015
Mobility in semiconducting carbon nanotubes at finite carrier density
Vasili Perebeinos1, J Tersoff, Phaedon Avouris
1IBM Research Division, T. J. Watson Research Center, Yorktown Heights, New York 10598, USA. vperebe @us.ibm.cim
Abstract:
Carbon nanotube field-effect transistors operate over a wide range of electron or hole density, controlled by the gate voltage. Here we calculate the mobility in semiconducting nanotubes as a function of carrier density and electric field, for different tube diameters and temperatures. The low-field mobility is a nonmonotonic function of carrier density and varies by as much as a factor of 4 at room temperature. At low density, with increasing field the drift velocity reaches a maximum and then exhibits negative differential mobility, due to the non-parabolicity of the band structure. At a critical density, rho(c) approximately 0.35-0.5 electrons/nm, the drift velocity saturates at around one-third of the Fermi velocity. Above rho(c), the velocity increases with field strength with no apparent saturation.
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