Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Videos

Depth sectioning with the aberration-corrected scanning transmission electron microscope.

Albina Y Borisevich1, Andrew R Lupini, Stephen J Pennycook

  • 1Condensed Matter Sciences Division, Oak Ridge National Laboratory, TN 37831, USA. albinab@ornl.gov

Proceedings of the National Academy of Sciences of the United States of America
|February 24, 2006
PubMed
Summary
This summary is machine-generated.

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Nanoscale Optical Inhomogeneities From Compositional Segregation Within Individual GaN-on-Si Quantum Wells.

Advanced science (Weinheim, Baden-Wurttemberg, Germany)·2026
Same author

Entropy-Enabled Hierarchical Defect Architecture for Dual Enhancement of Thermoelectric and Mechanical Performance in SnTe Alloys.

Advanced materials (Deerfield Beach, Fla.)·2026
Same author

Twist-Angle-Dependent Excitons in Moiré MoTe<sub>2</sub> Visualized by Cryogenic STEM and Monochromated EELS.

Nano letters·2026
Same author

Mesoscale atomic engineering in a crystal lattice.

Nature·2026
Same author

Rational Design of Weakly-Solvating Molecules for Salt-In-Pre-Ionic-Liquid Electrolytes for Li Metal Batteries.

Advanced science (Weinheim, Baden-Wurttemberg, Germany)·2026
Same author

Point Defect Engineering Thermoelectrics: From Disorder to Order.

Advanced materials (Deerfield Beach, Fla.)·2026

Aberration correction in scanning transmission electron microscopes enables nanometer-scale depth resolution, allowing for 3D imaging of materials like metal clusters and single atoms.

Area of Science:

  • Materials Science
  • Microscopy
  • Nanotechnology

Background:

  • Scanning transmission electron microscopy (STEM) traditionally offers high transverse resolution.
  • Limitations in depth resolution have hindered 3D imaging capabilities in STEM.
  • Aberration correction is a key advancement in electron microscopy.

Purpose of the Study:

  • To define and demonstrate depth resolution in aberration-corrected STEM.
  • To enable 3D imaging of nanoscale objects using optical sectioning.
  • To investigate the factors influencing effective focal depth.

Main Methods:

  • Developing a definition for depth resolution in STEM.
  • Applying aberration correction to the probe-forming lens.
  • Utilizing optical sectioning for 3D reconstruction.

Related Experiment Videos

  • Performing statistical analysis to determine effective focal depth.

    • Main Results:

    • Achieved nanometer-scale depth resolution in STEM.
    • Successfully performed 3D imaging of catalytic metal clusters and single atoms.
    • Quantified effective focal depth and analyzed contributing factors.
    • Demonstrated the potential for optical sectioning in nanoscale imaging.

    Conclusions:

    • Aberration correction significantly enhances STEM capabilities, enabling 3D nanoscale imaging.
    • The developed method provides depth resolution crucial for understanding nanostructure morphology.
    • Future instruments promise further advancements in 3D imaging resolution and applications.