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Updated: Aug 10, 2026

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
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Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

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Projected potential profiles across interfaces obtained by reconstructing the exit face wave function from through

Somnath Bhattacharyya1, Christoph T Koch, Manfred Rühle

  • 1Max-Planck-Institut für Metallforschung, HeisenbergStrasse 3, Stuttgart-70569, Germany. somnath@mf.mpg.de

Ultramicroscopy
|March 15, 2006
PubMed

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