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Updated: Aug 10, 2026

Atomic Layer Deposition of Vanadium Dioxide and a Temperature-dependent Optical Model
Published on: May 23, 2018
[A rapid method for the measurement of major and minor elements in vanadium titanium magnetite sample]
Yong-Jun Chen1, Sai-Wen Deng, De-Fan Dong
1National Research Center of Geoanalysis, Beijing 100037, China.
Abstract:
A high resolution (203 eV/Mn Kalpha) portable X-ray fluorescence spectrometer has been developed and the measurement of major and minor elements in vanadium titanium magnetite sample was carried out. An 241Am radioactive source for X-ray excitation, a Si-PIN detector and a 2048 channel analyzer for the measurement of vanadium titanium magnetite direct powder sample were used. The correction methods for interferences, calibration and drift are presented. The method is simply, accurate and rapid. The detection limit is an order of magnitude lower compared with a sealed proportional counter system.
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