Gary J Saulnier1, Alexander S Ross, Ning Liu
1Department of Electrical, Computer and Systems Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180-3590, USA. saulng@rpi.edu
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This study presents a novel voltage source for applied-voltage Electrical Impedance Tomography (EIT) systems. The developed calibration method ensures accurate conductivity measurements by minimizing system non-idealities.
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