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Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography
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Defect analysis in crystals using X-ray topography

Balaji Raghothamachar1, Govindhan Dhanaraj, Jie Bai

  • 1Department of Materials Science and Engineering, SUNY at Stony Brook, Stony Brook, New York 11794-2275, USA. braghoth@notes.cc.sunysb.edu

Microscopy Research and Technique
|April 29, 2006
PubMed

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