Scanning Electron Microscopy
Super-resolution Fluorescence Microscopy
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Updated: Jun 13, 2026

Implementation of a Nonlinear Microscope Based on Stimulated Raman Scattering
Published on: July 6, 2019
Jieping Ding1, Ling'en Liu1, Ni Wang2
1School of Materials Science and Engineering, Beijing University of Technology, Beijing, China.
High-temperature in situ scanning electron microscopy (SEM) imaging is improved by a new system that reduces thermal electron noise. This rapid scanning approach enhances image quality and speeds up data acquisition for materials analysis.
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