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Energy-resolving X-ray fluorescence detection using synthetic multilayers.

K Zhang1, G Rosenbaum, G Bunker

  • 1Department of Biological, Chemical and Physical Sciences, Illinois Institute of Technology, Chicago, IL 60439, USA.

Journal of Synchrotron Radiation
|May 12, 2006
PubMed
Summary
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Synthetic multilayers offer advanced energy-resolving detectors for X-ray absorption fine structure (XAFS) experiments. These novel detectors enhance XAFS measurements, especially for dilute biological systems at synchrotron sources.

Area of Science:

  • Materials Science
  • Spectroscopy
  • Synchrotron Radiation

Background:

  • X-ray absorption fine structure (XAFS) experiments require precise energy resolution for X-ray fluorescence detection.
  • Conventional detectors face limitations with increasing photon fluxes and dilute samples.

Purpose of the Study:

  • To discuss the potential of synthetic multilayers for energy-resolving X-ray fluorescence in XAFS.
  • To introduce novel multilayer-based detector designs for improved XAFS analysis.

Main Methods:

  • Design of two detection systems utilizing curved and graded synthetic multilayers.
  • Selection of X-ray fluorescence photons across a wide energy range with a large solid angle.

Main Results:

Related Experiment Videos

  • Multilayer detectors offer advantages over crystal-array detectors, including wider acceptance angles and bandwidth.
  • The proposed system is simpler to construct and more adaptable to energy changes.
  • Multilayer detectors show superiority over ionization chambers and conventional Ge detectors for XAFS.

    • Conclusions:

    • Synthetic multilayers provide a superior detection system for XAFS, particularly for dilute systems.
    • This technology enhances XAFS measurements at third-generation synchrotron sources.
    • The system overcomes incident-count-rate bottlenecks in current fluorescence detectors.