Monitoring small defects on surface microstructures through backscattering measurements

Related Experiment Video

Updated: Aug 8, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

P Albella1, F Moreno, J M Saiz

  • 1Grupo de Optica, Departamento de Física Aplicada, Universidad de Cantabria, Spain. albellap@unican.es

Optics Letters
|May 12, 2006
PubMed

More Related Videos

Laser Micromachining for Polymer Surface Topography Design05:49

Laser Micromachining for Polymer Surface Topography Design

Published on: September 19, 2025

Measuring Material Microstructure Under Flow Using 1-2 Plane Flow-Small Angle Neutron Scattering09:08

Measuring Material Microstructure Under Flow Using 1-2 Plane Flow-Small Angle Neutron Scattering

Published on: February 6, 2014

Related Concept Videos

Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...