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Optics Express|June 24, 2009
Backscattering of metallic microstructures with small defects located on flat substratesP Albella, F Moreno, J M Saiz, et al.Optics Express|August 20, 2008
Surface inspection by monitoring spectral shifts of localized plasmon resonancesP Albella, F Moreno, J M Saiz, et al.Optics Letters|May 12, 2006
Monitoring small defects on surface microstructures through backscattering measurementsP Albella, F Moreno, J M Saiz, et al.Optics Letters|June 17, 2009
Nanoscopic surface inspection by analyzing the linear polarization degree of the scattered lightP Albella, J M Saiz, J M Sanz, et al.Optics Express|December 18, 2010
Extended discrete dipole approximation and its application to bianisotropic mediaR Alcaraz de la Osa, P Albella, J M Saiz, et al.Optics Letters|May 27, 2006
Plasmon spectroscopy of metallic nanoparticles above flat dielectric substratesF Moreno, F González, J M SaizOptics Express|October 7, 2021
CDDA: extension and analysis of the discrete dipole approximation for chiral systemsS A Rosales, P Albella, F González, et al.Journal of the Optical Society of America. A, Optics, Image Science, and Vision|March 18, 2005
Two-particle model to study fluctuations of scattered radiation: multiple-scattering effectsO Merchiers, J M Saiz, F González, et al.Optics Express|August 20, 2008
Interaction of nanoparticles with substrates: effects on the dipolar behaviour of the particlesF Moreno, B García-Cámara, J M Saiz, et al.Applied Optics|July 21, 2011
Polar decomposition of the Mueller matrix: a polarimetric rule of thumb for square-profile surface structure recognitionJ M Sanz, J M Saiz, F González, et al.Pageof 217