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Laue orientation imaging.

H R Wenk1, F Heidelbach, D Chateigner

  • 1Laboratoire de Cristallographie, CNRS, Grenoble, France.

Journal of Synchrotron Radiation
|March 1, 1997
PubMed
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This study introduces an automated method using synchrotron X-rays to determine crystal orientation in polycrystals. The technique enables precise local orientation mapping for texture analysis in materials like olivine.

Area of Science:

  • Materials Science
  • Crystallography
  • Synchrotron Radiation

Background:

  • Accurate determination of crystal orientation is crucial for understanding material properties and behavior.
  • Traditional methods for orientation mapping can be time-consuming and may lack spatial resolution.

Purpose of the Study:

  • To develop and validate an automated method for extracting crystal orientation information from polycrystals using synchrotron X-ray Laue diffraction.
  • To enable high-resolution local orientation mapping for advanced texture analysis.

Main Methods:

  • Utilized a highly focused synchrotron X-ray beam (10-30 microm) at the European Synchrotron Radiation Facility (ESRF).
  • Recorded transmission Laue patterns from thin polycrystal slices using a CCD detector.
  • Applied gnomonic projection and Hough transform for automated identification of crystallographic zones and calculation of crystal orientation.

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Main Results:

  • Successfully demonstrated the automated recording of Laue patterns and extraction of orientation data from polycrystals.
  • The method provides orientation information comparable to electron-backscattering pattern techniques.
  • Illustrated the technique's efficacy using the orthorhombic magnesium silicate olivine.

Conclusions:

  • The developed synchrotron X-ray Laue diffraction method offers an efficient and automated approach for local orientation mapping in polycrystals.
  • This technique is valuable for detailed texture analysis in materials science research.
  • The method shows promise for analyzing various crystalline materials, including geological samples.