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Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
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On the off-Bragg reflectivity enhancement in dynamical multiple diffraction of X-rays by an In(0.5)Ga(0.5)P/GaAs

M V Kovalchuk1, A Y Kreines, L V Samoilova

  • 1A. V. Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii Prospekt 59, 117333 Moscow, Russia.

Journal of Synchrotron Radiation
|May 1, 1997
PubMed

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