Conducting-probe AFM nanoscale joule heating yields charge-density-wave transition detection

Area of Science:

• Condensed Matter Physics
• Materials Science
• Nanotechnology

Background:

• Layered transition-metal dichalcogenides possess unique electronic properties.
• Understanding thermal effects at the nanoscale is crucial for device applications.
• Conducting probe atomic force microscopy (CP-AFM) offers high spatial resolution.

Purpose of the Study:

• To investigate probe-mediated thermal processes in layered transition-metal dichalcogenides under high current densities.
• To explore the potential of CP-AFM for detecting solid-state bulk characteristics.
• To identify signatures of local heating in current-potential (i/V) curves.

Main Methods:

• Utilized conducting probe atomic force microscopy (CP-AFM) to apply high current densities to layered transition-metal dichalcogenides.
• Analyzed current-potential (i/V) curves to detect thermal signatures.
• Investigated the charge-density-wave (CDW) transition in 1T-TaSe(2) samples.

Main Results:

• Observed a distinct signature of local Joule heating in the i/V curves.
• Successfully detected the charge-density-wave (CDW) transition in 1T-TaSe(2) occurring above room temperature.
• Demonstrated that nanoscale Joule heating can be a useful tool for probing material properties.

Conclusions:

• Conducting probe AFM, combined with nanoscale Joule heating, provides a novel method for investigating solid-state bulk characteristics.
• This technique enables straightforward detection of phase transitions like the CDW transition in materials such as 1T-TaSe(2).
• The findings highlight a new application of CP-AFM in materials characterization.