Evaluation of charge-injection devices for use in laue diffraction imaging

Area of Science:

• Materials Science
• Crystallography
• Detector Technology

Background:

• Charge-injection devices (CIDs) are adaptable detectors with features suitable for X-ray diffraction pattern imaging.
• Their nondestructive readout allows for image quality assessment during data collection and rapid readout of specific device areas.

Purpose of the Study:

• To evaluate Charge-injection devices (CIDs) for X-ray diffraction imaging applications.
• To demonstrate the capabilities of CIDs in direct imaging, indirect imaging, and single X-ray photon counting with energy discrimination.

Main Methods:

• Utilized two CID formats (CID 17PPRA and CID 38SG) in position-sensitive detector systems for X-ray detection.
• Employed a phosphor sheet for indirect X-ray to optical photon conversion for the CID 38SG.
• Performed direct X-ray detection with the CID 17PPRA.
• Demonstrated single photon counting with energy discrimination using the CID 17PPRA.

Main Results:

• Successfully collected indirect Laue diffraction images of MoS(2) and tetraphenylphosphonium tetrachlorooxomolybdenum(V) using the CID 38SG.
• Recorded direct X-ray Laue diffraction images of MoS(2) with the CID 17PPRA.
• Achieved single X-ray photon counting with energy discrimination using the CID 17PPRA, obtaining useful data from single pixels at rates exceeding 7 kHz.

Conclusions:

• Charge-injection devices (CIDs) demonstrate significant potential for various X-ray diffraction imaging techniques.
• While direct and indirect imaging are feasible, complete energy-dispersive analysis for space group determination is currently limited by charge collection inefficiencies and split events.