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Updated: Aug 8, 2026

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
Published on: March 12, 2017
An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic
M D Croitoru1, D Van Dyck, S Van Aert
1EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020, Antwerp, Belgium. mihail.croitoru@ua.ac.be
Abstract:
We propose an improved image simulation procedure for atomic-resolution annular dark-field scanning transmission electron microscopy (STEM) based on the multislice formulation, which takes thermal diffuse scattering fully into account. The improvement with regard to the classical frozen phonon approach is realized by separating the lattice configuration statistics from the dynamical scattering so as to avoid repetitive calculations. As an example, the influence of phonon scattering on the image contrast is calculated and investigated. STEM image simulation of crystals can be applied with reasonable computing times to problems involving a large number of atoms and thick or large supercells.
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