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Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous

D G Şentürk1, A De Backer1, S Van Aert1

  • 1Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; NANOlab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.

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This study introduces a new method using annular dark-field scanning transmission electron microscopy (ADF STEM) to accurately count atoms in heterogeneous nanoparticles. This technique offers a dose-efficient alternative for analyzing beam-sensitive nanomaterials.

Keywords:
4D STEMAtom countingAtomic resolution scanning transmission electron microscopyHeterogeneous nanostructuresOptimal experiment design

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Microscopy

Background:

  • Accurate atom counting in heterogeneous nanoparticles is crucial for understanding their properties.
  • Conventional methods can be time-consuming or damaging to beam-sensitive materials.

Purpose of the Study:

  • To develop a novel, dose-efficient methodology for quantifying atoms in heterogeneous nanoparticles.
  • To improve the accuracy of atom counting in nanomaterials using advanced electron microscopy techniques.

Main Methods:

  • Utilizing multiple annular dark-field scanning transmission electron microscopy (ADF STEM) images.
  • Employing optimal statistical experiment design for detector region selection.
  • Comparing experimental scattering cross-sections with simulated library values to minimize squared differences.

Main Results:

  • Successfully demonstrated the methodology for simulated Ni@Pt and Au@Ag core-shell nanoparticles.
  • The developed method provides accurate atom counts in heterogeneous nanoparticle systems.
  • The approach is shown to be more dose-efficient than combined ADF STEM and energy-dispersive X-ray spectroscopy.

Conclusions:

  • The presented methodology offers a robust and efficient way to count atoms in heterogeneous nanoparticles.
  • This technique is particularly valuable for the study of beam-sensitive nanomaterials.
  • The findings pave the way for more precise characterization of complex nanostructures.