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Atom counting from a combination of two ADF STEM images

D G Şentürk1, C P Yu1, A De Backer1

  • 1Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; NANOlab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.

Ultramicroscopy
|October 1, 2023
PubMed

Keywords:
4D STEMAtom countingAtomic resolution scanning transmission electron microscopyHeterogeneous nanostructuresMultivariate Gaussian mixture model

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