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Atom counting from a combination of two ADF STEM images
D G Şentürk1, C P Yu1, A De Backer1
1Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; NANOlab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
Ultramicroscopy
|October 1, 2023
Summary
This study enhances atom counting in nanostructures using multiple scanning transmission electron microscopy images. The advanced statistical method improves accuracy, especially for low-dose and multi-element samples.
Area of Science:
- Materials Science
- Nanotechnology
- Electron Microscopy
Background:
- Understanding nanostructure properties requires accurate atomic quantification.
- Statistical methods previously enabled atom counting from single images.
- Simultaneous acquisition of multiple images is a recent advancement.
Purpose of the Study:
- To develop an improved statistical method for atom counting in nanostructures.
- To leverage multiple annular dark-field scanning transmission electron microscopy (ADF STEM) images for enhanced accuracy.
- To enable precise atom counting in challenging imaging conditions.
Main Methods:
- An extended statistics-based method was developed.
- The method combines multiple statistically independent ADF STEM images.
- Images were reconstructed from non-overlapping annular detector collection regions.
Main Results:
- The combined image approach significantly improves atom counting accuracy.
- Precise atom counts were achieved even with low electron doses.
- The method is effective for multi-element nanostructures.
Conclusions:
- The presented method offers a robust solution for accurate atomic quantification in nanostructures.
- This technique is crucial for advancing structure-property relationship studies.
- It enhances the reliability of atom counting from ADF STEM imaging data.
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