Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Videos

Normal-incidence generalized ellipsometry using the two-modulator generalized ellipsometry microscope.

Gerald E Jellison1, John D Hunn, Christopher M Rouleau

  • 1Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA. jellisongejr@ornl.gov

Applied Optics
|July 21, 2006
PubMed
Summary
This summary is machine-generated.

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Spontaneous Polarization Suppression of Exciton-Exciton Annihilation in Rhombohedral-Stacked Bilayer Molybdenum Disulfide.

ACS nano·2026
Same author

Substrate-Directed Underlayer Growth of Bilayer MoS<sub>2</sub> Revealed by Mo Isotope Labeling.

ACS nano·2026
Same author

Direct Observation of Ultrafast Defect-Bound and Free Exciton Dynamics in Defect-Engineered WS<sub>2</sub> Monolayers.

ACS nano·2026
Same author

Deep Learning with Reflection High-Energy Electron Diffraction Images to Predict Cation Ratio in Sr<sub>2</sub>Ti<sub>2(1-</sub>O<sub>3</sub> Thin Films.

Nano letters·2025
Same author

Autonomous Synthesis of Thin Film Materials with Pulsed Laser Deposition Enabled by In Situ Spectroscopy and Automation.

Small methods·2024
Same author

Anomalous isotope effect on the optical bandgap in a monolayer transition metal dichalcogenide semiconductor.

Science advances·2024

A novel microscope measures material polarization characteristics with 4-micrometer resolution. This instrument accurately determines eight Mueller matrix parameters, crucial for understanding optical properties.

Area of Science:

  • Optical Physics
  • Materials Science
  • Microscopy

Background:

  • Characterizing polarization properties of materials is essential for understanding their optical behavior.
  • Existing techniques may lack the resolution or comprehensive parameter measurement needed for detailed analysis.

Purpose of the Study:

  • To introduce a new microscope for measuring polarization characteristics in normal-incidence reflection.
  • To demonstrate the instrument's capability for high-resolution Mueller matrix measurements.

Main Methods:

  • Development of a new microscope system.
  • Measurement of eight parameters of the sample Mueller matrix.
  • Utilizing normal-incidence reflection geometry.

Main Results:

Related Experiment Videos

  • Achieved a lateral resolution of 4 micrometers.
  • Demonstrated accurate determination of Mueller matrix elements (better than 0.001-0.002 for small values).
  • Presented examples for aluminum, rutile (TiO2), and calcite (CaCO3).

Conclusions:

  • The new microscope provides a powerful tool for detailed polarization analysis of materials.
  • The instrument's high accuracy and resolution enable precise characterization of optical properties.
  • This technology has potential applications in various fields requiring material optical property assessment.