Related Experiment Video
Updated: Aug 6, 2026

Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures
Published on: October 9, 2012
Electron inelastic scattering and anisotropy: The two-dimensional point of view
G Radtke1, G A Botton, J Verbeeck
1Brockhouse Institute for Materials Research, McMaster University, 1280 Main Street West, Hamilton, Ontario, Canada L8S 4M1.
Abstract:
The measurement of the electronic structure of anisotropic materials using energy loss near edge structure (ELNES) spectroscopy is an important field of microanalysis in transmission electron microscopy. We present a novel method to study the angular dependence of electron inelastic scattering in anisotropic materials. This method has been applied to the study of 1s-->pi* and sigma* transitions on the carbon K edge in pyrolitic graphite. An excellent agreement between experimental and theoretical two-dimensional scattering patterns has been found. In particular, the need of a fully relativistic calculation of the inelastic scattering cross-section to explain the experimental results is demonstrated.
Related Concept Videos
Scanning Electron Microscopy
Fundamental Principles
Accelerated...
The Quantum-Mechanical Model of an Atom
The Uncertainty Principle
The de Broglie Wavelength
Electron Microscope Tomography and Single-particle Reconstruction
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
π Electron Effects on Chemical Shift: Overview

