Hard X-ray microscopy with Zernike phase contrast
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Updated: Aug 6, 2026

Phase Contrast and Differential Interference Contrast (DIC) Microscopy
Published on: August 6, 2008
1Pohang Accelerator Laboratory, Pohang University of Science and Technology, 31 San, Hyoja-dong, Pohang, KyungBuk, Korea, 790-784. hsyoun@postech.edu
Abstract:
Zernike phase contrast has been added to a full-field X-ray microscope with Fresnel zone plates that was in operation at 6.95 keV. The spatial resolution has also been improved by increasing the magnification of the microscope objective looking at the CsI(Tl) scintillation crystal. Cu no. 2000 meshes and a zone plate have been imaged to see the contrast as well as the spatial resolution. A Halo effect coming from the Zernike phase contrast was clearly visible on the images of meshes.
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