Kim Hwa Lim1, Joon-Ho Lee, Gang Ye
1Department of Electrical and Computer Engineering, Duke University, Durham, NC 27708-0291, USA.
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The spectral element method (SEM) significantly reduces computational demands for 3D electrical impedance tomography (EIT) forward problems. SEM requires fewer nodes than the finite element method (FEM), enabling faster and more memory-efficient simulations with comparable or improved accuracy.
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