O H Kapp1, D R Smith, G Jendraszkiewicz
1Enrico Fermi Institute, University of Chicago, 5640 S. Ellis Ave., Chicago Il 60637, USA. bud@midway.uchicago.edu
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A new flexible instrument control system enhances scanning electron microscope imaging. This adaptable system works with various operating voltages and instruments, including custom low-voltage microscopes and free electron lasers.
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