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Updated: Aug 6, 2026

Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization
Published on: September 8, 2023
Polarization-dependent Talbot effect
Yunqing Lu1, Changhe Zhou, Shunquan Wang
1Information Optics Laboratory, Shanghai Institute of Optics and Fine Mechanics, Academia Sinica, Graduate School of the Chinese Academy of Sciences, PO Box 800-211, Shanghai 201800, China.
Abstract:
The term "polarization-dependent Talbot effect" means that the Talbot self-imaging intensity of a high-density grating is different for TE and TM polarization modes. Numerical simulations with the finite-difference time-domain method show that the polarization dependence of the Talbot images is obvious for gratings with period d between 2 lambda and 3 lambda. Such a polarization-dependent difference for TE and TM polarization of a high-density grating of 630 lines/mm (corresponding to d/lambda=2.5) is verified through experiments with the scanning near-field optical microscopy technique, in which a He-Ne laser is used as its polarization is changed from the TE mode to the TM mode. The polarization-dependent Talbot effect should help us to understand more clearly the diffraction behavior of a high-density grating in nano-optics and contribute to wide application of the Talbot effect.
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