Related Experiment Video
Updated: Aug 6, 2026

The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements
Published on: December 5, 2025
Measurement of the terahertz-induced phase shift in electro-optic sampling for an arbitrary biasing phase
1Nonlinear Optics Laboratory, Institute of Quantum Electronics, ETH Zurich, Switzerland. arno@phys.ethz.ch
Abstract:
We present a simple method to correct for nonlinearities in the detection of terahertz (THz) transients by electro-optic sampling. The THz-induced phase shift of the optical probe beam is calibrated with an additional biasing phase from a variable wave plate. All the parameters that are needed for the determination of this phase shift can be directly measured, which makes the method insensitive to errors resulting from residual birefringences of the electro-optic material or imperfections of the wave plate. We show that the THz-induced phase shift is correctly revealed for a wide range of the biasing phase.
More Related Videos
Related Concept Videos
Electrochemical Systems
Time and frequency -Domain Interpretation of Phase-lead Control
The design of phase-lead control involves the strategic placement of poles and zeros to balance steady-state error and system...
Gain
Gain:
Suppose Vin is the input and Vout is the output signal to a circuit.
Biasing of Metal-Semiconductor Junctions
In Schottky junctions, where the semiconductor is n-type, applying a positive voltage to the metal relative to the semiconductor reduces its Fermi...
Bode Plots Construction

