Zhiguo Liu1, Zhuang Li, Gang Wei
1State Key Laboratory of Electroanalytical Chemistry, Changchun Institute of Applied Chemistry, Graduate School of the Chinese Academy of Sciences, Chinese Academy of Sciences, Changchun, China.
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A modified tapping mode for atomic force microscopy (AFM) enables precise manipulation, dissection, and lithography. This adaptable technique controls tip-sample interactions without extra equipment, broadening AFM applications.
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